11 results
Sputtering yield measurements with size-selected gas cluster ion beams
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1181 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1181-DD13-25
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- 2009
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Electronic Structure of Ionic Liquids Studied by UV Photoemission and Inverse Photoemission Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 965 / 2006
- Published online by Cambridge University Press:
- 26 February 2011, 0965-S13-10
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- 2006
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The Effect of Atmospheric Doping on the Interfacial Electronic Structure of Phthalocyanine Thin Films as Studied by UPS
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- Journal:
- MRS Online Proceedings Library Archive / Volume 871 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, I6.24
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- 2005
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Effects of Various Types of Doping on the Electronic Structure of Organic Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 871 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, I8.11
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- 2005
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High-speed Processing with Reactive Cluster Ion Beams
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- Journal:
- MRS Online Proceedings Library Archive / Volume 843 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, T3.36
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- 2004
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Low Damage Smoothing of Magnetic Materials using Oblique Irradiation of Gas Cluster Ion Beam
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- Journal:
- MRS Online Proceedings Library Archive / Volume 843 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, T5.5
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- 2004
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High-speed Processing with Cluster Ion Beams
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- Journal:
- MRS Online Proceedings Library Archive / Volume 792 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, R9.29
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- 2003
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Fast Neutral Ar Penetration during Gas Cluster Ion Beam Irradiation into Magnetic Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 792 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, R9.36
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- 2003
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Threshold Energy for Generating Damage with Cluster Ion Irradiation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 749 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, W17.13
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- 2002
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Ar Cluster Ion Bombardment Effects on Semiconductor Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 647 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, O9.4
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- 2000
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Molecular Dynamics Simulation of Fullerene Cluster Ion Impact
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- Journal:
- MRS Online Proceedings Library Archive / Volume 504 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 81
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- 1997
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